Please use this identifier to cite or link to this item: http://hdl.handle.net/10174/20525

Title: Comparison of Photovoltaic panel’s standard and simplified models
Authors: Rashel, Masud Rana
Albino, André
Viega, Angela
Ahmed, Md. Tofael
Tlemçani, Mouhaydine
Gonçalves, Teresa
Keywords: Photovoltaic cell
Series Resistance
Shunt Resistance
Error Function
Issue Date: 9-Jan-2017
Publisher: IEEE
Citation: M. R. Rashel, A. Albino, A. Veiga, M. T. Ahmed, M. Tlemcani and T. C. F. Goncalves, "Comparison of Photovoltaic panel's standard and simplified models," 2016 International Conference for Students on Applied Engineering (ICSAE), Newcastle upon Tyne, 2016, pp. 133-136. doi: 10.1109/ICSAE.2016.7810175
Abstract: Shockley diode equation is basic for single diode model equation, which is overly used for characterizing the photovoltaic cell output and behavior. In the standard equation, it includes series resistance (Rs) and shunt resistance (Rsh) with different types of parameters. Maximum simulation and modeling work done previously, related to single diode photovoltaic cell used this equation. However, there is another form of the standard equation which has not included Series Resistance (Rs) and Shunt Resistance (Rsh) yet, as the Shunt Resistance is much bigger than the load resistance and the load resistance is much bigger than the Series Resistance. For this phenomena, very small power loss occurs within a photovoltaic cell. This research focuses on the comparison of two forms of basic Shockley diode equation. This analysis describes a deep understanding of the photovoltaic cell, as well as gives understanding about Series Resistance (Rs) and Shunt Resistance (Rsh) behavior in the Photovoltaic cell. For making estimation of a real time photovoltaic system, faster calculation is needed. The equation without Series Resistance and Shunt Resistance is appropriate for the real time environment. Error function for both Series resistance (Rs) and Shunt resistances (Rsh) have been analyzed which shows that the total system is not affected by this two parameters' behavior.
URI: http://hdl.handle.net/10174/20525
ISBN: 978-1-4673-9053-8
Type: article
Appears in Collections:CGE - Artigos em Livros de Actas/Proceedings

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