Request a document copy: Defect Characterization With Eddy Current Testing Using Nonlinear-Regression Feature Extraction and Artificial Neural Networks

Requester name:
Requester Email:
Files:
all files (of this document) in restricted access
the file(s) you requested
Message:

 

Dspace Dspace
DSpace Software, version 1.6.2 Copyright © 2002-2008 MIT and Hewlett-Packard - Feedback
UEvora B-On Curriculum DeGois